Model: MB 155S
Internal Source: dual SiC / NIR
Optics: KCl
Detector: MIR-NIR DTGS
Spectral range cm-1: 12,000-450

Specifications:

• Best resolution: 0.7 cm-1, unapodized.
• Wavenumber reproducibility:
  • Mid IR models: 0,1 cm-1 at 1918 cm-1
  • Near IR models: 0,04 cm-1 at 7300 cm-1.
• Wavenumber repeatability ± 0.002 cm-1 (±2σ).
• Calibration transferability test: All NIR models will reproduce the absorbance spectrum of toluene (4100-6000 cm-1) in a 0.5 mm cell at 28°C ± 1° to within 0.002 A when compared with any other NIR unit.
• Mid IR Signal-to-RMS-noise ratio at peak response is typically 30,000: 1 for the MB100 for 1 min scan time, 4 cm-1 resolution, open beam.
• Near IR RMS-noise absorbance at peak response is typically 4 micro-A for 1 min scan time, 16 cm-1 resolution, open beam.
• 100% line reproducibility is within 0.1% in the 4000 to 550 cm-1 range for MIR models and the 8000 to 4500 cm-1 range for NIR models, for 2 consecutive measurements.
• 100% line long-term stability is affected only by temperature change. Temperature coefficient of change in 100% line is 1% / 1°C at 8000 cm-1 for Near IR models and at 4000 cm-1 for Mid IR models.
• Resolution selectable from 1 (2 in NIR mode) to 64 cm-1, (apodized resolution) in steps of 2 X.
• Two scan times available: 3 s for DTGS, 1.2 s for fast semiconductor detectors, at 4 cm-1 resolution.
• Arid-Zone sample compartment with countercurrent purge flow in telescopic purge tubes provides continuous purge up to sample. Arid-Zone sample compartment with “Open-architecture” provides free space for accessories.
• IR beam at sample focus is f/4.5.
• IR beam at sample focus has nominally 5 mm size.
• Beam diameter at beam stop is 2.5 cm.
• Maximum beam divergence: 90 milliradians.
• Sample focus is 3.5 in. (8.9 cm) above base.
• Free accessory space is 4 in. (10 cm) on each side of sample focus.